2018 Phil Kaufman Award Dinner, hosted by the ESD Alliance and IEEE Council on EDA, honoring Dr. Thomas W. Williams for his overall impact on the electronics industry through contributions to scan Design for Testability and related test automation.
2018 Phil Kaufman Award Dinner, hosted by the ESD Alliance and IEEE Council on EDA, honoring Dr. Thomas W. Williams for his overall impact on the electronics industry through contributions to scan Design for Testability and related test automation.