Laboratory Equipment Demonstration 

Hosokawa Micron Powder Systems will host a FREE Laboratory Equipment Demonstration on Wednesday, February 8, 2012 at  the Holiday Inn Houston West - Energy Corridor • 1112 Eldridge Parkway • Houston, TX. This program was offered in New Jersey in 2011 and due to the overwhelming response, the program will now be offered to customers in the South-Central United States.

The seminar will focus on laboratory sample analysis. Guests will observe coarse, fine and ultra fine samples being tested on the Micron Air Jet Sieve, an advanced, computer assisted particle size analyzer and the Micron Powder Characteristics Tester Model PT-X, the world's most innovative powder tester, capable of identifying 12 powder characteristics.  

The demonstration will start at 10:30 am and conclude by 2:30 pm EDT. Lunch will be served at noon.  The venue will be announced soon. This event is free to attend.

The Hosokawa Micron Air Jet Sieve utilizes the pneumatic sifting principle that enhances the accuracy and reproducibility of particle size analysis. Use of this device has become a preferred method for such tasks as quality assurance of incoming raw materials and the confirmation of final product specifications.

While negative pressure draws all the particles below a defined particle size down through a sieve screen, a positive airflow is introduced upwards through a rotating wand. This airflow deagglomerates and disperses undersized particles and carries them through to the vacuum collector. This device can be used with samples of 10 to 100 grams for chemicals, food, minerals and pharmaceutical materials.

Hosokawa’s Micron Powder  Characteristics Tester PT-X employs the methods developed by Ralph L. Carr (Carr Indices) to determine the “Flowability & Floodability” of dry powders.  The model PT-X is the latest design of the Hosokawa Micron Powder Characteristics Tester which utilizes state of the art features to identify the specific characteristics of powdered samples for a wide range of application fields.