This seminar will include a discussion of RF troubleshooting problems, tips and tricks to overcome them.
Topics covered include:
Seminar Abstract:
Modern products and systems present challenges for EMI testing and troubleshooting that simply didn’t exist years ago. Today’s electronics are full of technologies presenting numerous EMI testing challenges, particularly for traditional EMI test solutions. These challenges include switching power supplies, high speed system clocks and data busses, bursty information transfers, transmission line and termination issues, spread spectrum clocking, as well as the integration of wireless interfaces and connectivity. Traditional tools have difficulty identifying EMI problems in todays’ electronics.
A new approach is required to effectively troubleshoot EMI issues in these modern systems. The Mixed Domain Oscilloscope incorporates a wideband Spectrum Analyzer to a traditional mixed signal oscilloscope. This unique combination results in powerful capabilities that make troubleshooting transient RF and EMI signals fast and efficient. The Tektronix USB based real time spectrum analyzers (RSA series) also provide additional insight into locating EMI issues at a fraction of the cost. This presentation will explore the features of these new tools, and show how they can effectively uncover and troubleshoot transient EMI issues in modern systems.