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HORIBA Scientific
33-1 69 74 72 00
info-sci.fr@horiba.com

Optical Characterization of CIGS by Spectroscopic Ellipsometry Webinar

During this webinar, you will learn how to define a strategy to perform quantitative Spectroscopic Ellipsometry on CIGS semiconducting thin films. CIGS is among the most efficient absorbers for photovoltaic solar conversion. Deployed as thin film CIGS optical characterization is as important in its preparation stage as in the modeling of cell stack

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