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HORIBA Scientific
33-169747200
live-sci.fr@horiba.com

Discover an Innovative Compositional Depth Profiling Technique

Plasma Profiling TOFMS (PP-TOFMS) is a novel technique for material characterization that provides ultra-fast and direct elemental composition as a function of depth. We will show you through numerous examples the potential of PP-TOFMS for the development of your thin films and devices, from growth to processing.

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