When

Tuesday, August 15, 2017 from 11:45 AM to 1:15 PM EDT
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Where

Marcus Nanotechnology Building - Room 1117

345 Ferst Drive NW
Atlanta, GA 30332

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Contact

Eric Woods
Georgia Tech: Institute for Electronics and Nanotechnology & Materials Characterization Facility
404.385.2877
christa.ernst@ien.gatech.edu

MCF Seminar Series: Atom Probe Tomography

Atom Probe Tomography (APT) is the highest spatial resolution analytical characterization technique with high efficiency single atom detection for quantitative atomic scale 3D elemental mapping of chemical heterogeneities. Learn more about this technique and how it may be applied to your research at this event.

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