Tuesday, August 15, 2017 from 11:45 AM to 1:15 PM EDT
Add to Calendar


Marcus Nanotechnology Building - Room 1117

345 Ferst Drive NW
Atlanta, GA 30332

Event Address Map
Driving Directions


Eric Woods
Georgia Tech: Institute for Electronics and Nanotechnology & Materials Characterization Facility

MCF Seminar Series: Atom Probe Tomography

Atom Probe Tomography (APT) is the highest spatial resolution analytical characterization technique with high efficiency single atom detection for quantitative atomic scale 3D elemental mapping of chemical heterogeneities. Learn more about this technique and how it may be applied to your research at this event.

Registration is closed. This event has already been held.

Go back to Event Page