Wednesday, November 7, 2018 from 6:00 PM to 9:00 PM PST
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The GlassHouse

2 South Market Street
San Jose, CA 95113

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ESD Alliance - IEEE/CEDA 2018 Phil Kaufman Award Presentation and Dinner

2018 Phil Kaufman Award Dinner, hosted by the ESD Alliance and IEEE Council on EDA, honoring Dr. Thomas W. Williams for his overall impact on the electronics industry through contributions to scan Design for Testability and related test automation.

Registration is closed.