Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS Short Course

Principles, Practice, Instrumentation and Hands-on Data Analysis: A detailed introduction to the principles and practice of two techniques for analyzing the first few monolayers of a surface: XPS -the most common surface analytical method, and ToF-SIMS, a mass-spectroscopy-based method complementary in many ways to XPS.